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ITC 2020 : International Test Conference

Washington DC, USA

Event Date:	November 03, 2020 - November 05, 2020
Abstract Submission Deadline:	April 24, 2020
Submission Deadline:	May 01, 2020
Notification of Acceptance:	June 29, 2020
Camera Ready Version Due:	August 14, 2020

About

International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design verification, design-fortest, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.

ITC 2020 starts the second half century of the conference. Emerging technologies such as optical, biomedical, and quantum devices will require new test solutions. Artificial Intelligence (AI) and the need for trustworthy devices are providing both new challenges and new opportunities for off-chip and on-chip test. At the same time, more stringent quality requirements, especially in automotive applications, are requiring more efficient test, debug, monitoring, and repair techniques that can transfer to the field.

Call for Papers

Topics of interest include (but not limited to):

3D/2.5D Test
Adaptive Test in Practice
Artificial Intelligence (AI)/Machine Learning
in Test
ATE/Probe Card Design
Automotive Test
Advances in Boundary Scan
Bring-Up
Data Driven Methods
Data Exchange and Infrastructure
Defect-oriented Testing
DFM and Test
Diagnosis
Economics of Test
End-to-End Data Analysis
End-to-End System Security
Embedded BIST and DFT
Emerging Defect Mechanisms
Field Monitoring, Test, & Debug
Hardware Security and Trust
IoT Testing
Jitter, High-Speed I/O and RF Test
Known-Good-Die testing
Memory Test and Repair
MEMS Testing
Mixed-Signal and Analog Test
New Technologies and Test
On-Chip Test Compression
Online Test
Pre-Silicon Verification
Post- Silicon Validation
Power Issues in Test
Protocol-aware Test
Quantum Device Testing
Reliability and Resilience
Scan Based Test
SoC/SiP/NoC Test
Silicon Debug
Simulation and Emulation
System Test (Applications)
System Test (Hardware/Software)
Test-to-Design Feedback
Test Escape Analysis
Test Flow Optimizations
Test Generation and Validation
Test Resource Partitioning
Test Standards
Test Time Analysis and Reduction
Testing High Speed Optics/Photonics
Timing Test
Yield Analysis and Optimization

Summary

ITC 2020 : International Test Conference will take place in Washington DC, USA. It’s a 3 days event starting on Nov 03, 2020 (Tuesday) and will be winded up on Nov 05, 2020 (Thursday).

ITC 2020 falls under the following areas: TEST, DESIGN, etc. Submissions for this Conference can be made by May 01, 2020. Authors can expect the result of submission by Jun 29, 2020. Upon acceptance, authors should submit the final version of the manuscript on or before Aug 14, 2020 to the official website of the Conference.

Please check the official event website for possible changes before you make any travelling arrangements. Generally, events are strict with their deadlines. It is advisable to check the official website for all the deadlines.

Other Details of the ITC 2020

Short Name: ITC 2020
Full Name: International Test Conference
Timing: 09:00 AM-06:00 PM (expected)
Fees: Check the official website of ITC 2020
Event Type: Conference
Website Link: http://www.itctestweek.org/wp-content/uploads/2020/03/ITC_2020_Call_for_Papers_ext_Mar2020.pdf
Location/Address: Washington DC, USA

Credits and Sources

[1] ITC 2020 : International Test Conference

ITC 2020 : International Test Conference

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About

Call for Papers

Summary

Other Details of the ITC 2020

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